Foundations of Electron Microscopy

Foundations of Electron Microscopy

When: January 10-11, 2017

Instructor: Professor Marc De Graef, Materials Science and Engineering, Carnegie Mellon University

Location: Johns Hopkins University, Homewood Campus, Baltimore, MD

About the course:

This two-day course provides an in-depth overview of the physics of image and diffraction pattern formation in both scanning electron microscopy (SEM) and transmission electron microscopy (TEM).  The course will begin with an overview of electron scattering, leading to the formulation of the Governing Equation (a form of the Schroedinger Equation) and several solution methods.  Emphasis will be placed on obtaining an understanding of the mechanisms of image and diffraction pattern formation, including ways to simulate such patterns. Both SEM and TEM techniques will be covered, both in the context of defect free crystals and image formation in the presence of lattice defects.  We conclude the course with a detailed introduction to the automated indexing of diffraction patterns.

This course is directed at graduate students and post-doctoral researchers who wish to attain a deeper understanding of electron scattering techniques, including the simulation of images and diffraction patterns.

• Specific topics to be covered include:
• Basic Crystallography
• Electron Scattering by Atoms, Unit Cells, and Crystals
• Experimental Modalities and Geometries: SEM and TEM
• Electron scattering: the Governing Equation
• Solution Methods
• TEM: Electron Diffraction from Perfect Crystals
• SEM: Electron Diffraction from Perfect Crystals
• Defects in Crystals: Applications for SEM and TEM
• Orientation Representations
• Dictionary-based Indexing of Electron Diffraction Patterns

About the instructor:

Professor De Graef received his BS and MS degrees in physics from the University of Antwerp (Belgium) in 1983, and his Ph.D. in physics from the Catholic University of Leuven (Belgium) in 1989, with a thesis on copper-based shape memory alloys. He then spent three and a half years as a post-doctoral researcher in the Materials Department at the University of California at Santa Barbara before joining Carnegie Mellon in 1993 as an assistant professor.  He is currently full professor and co-director of the J. Earle and Mary Roberts Materials Characterization Laboratory.  He is a Fellow of the Microscopy Society of America, and he received the TMS Educator Award in 2012.  Professor De Graef’s research interests lie in the area of microstructural characterization of structural intermetallics and magnetic materials. His current focus is on the development of experimental and modeling techniques for the quantitative analysis of electron scattering data, including defect images and diffraction patterns, as well as indexing techniques for such diffraction patterns. He has published more that 250 papers in peer-reviewed journals, as well as two text books.

Registration:

Continental breakfast, lunch, the informal social and course materials are included in the cost of registration. Registration is now closed.

Schedule:

Click HERE for a pdf of the course schedule

Travel and Accommodations:

For those traveling by air, we recommend flying in to BWI Thurgood Marshall Airport in Baltimore.
Shuttle, taxi and rental car options are readily available at BWI for a reasonable price.
For those traveling by train, Baltimore’s Penn Station is a 10 minute drive from campus.
The Inn at the Colonnade is located within walking distance of Homewood Campus.

Cancellation Policy:

Update: the course will run as scheduled.

HEMI reserves the right to cancel a course up to 2 weeks before the scheduled presentation date. Please contact the HEMI office to confirm that the course is happening before making non-refundable travel arrangements.

Campus Map:
View a map of the Johns Hopkins Homewood Campus by clicking here.