December 19, 2018 @ 3:30 pm - 4:30 pm
Probe-corrected scanning transmission electron
microscopy (STEM) offers superior performance in the
analysis of nanomaterial by providing atomic resolution
imaging and spectroscopy. This presentation aims to
review the specifications and characteristics of the FEI
Probe-Corrected Titan3™ 80-300 S/TEM, demonstrate the
capabilities of this advanced analytical workstation and its
attachments such as energy-dispersive X-ray spectroscopy
(XEDS) and electron energy loss spectroscopy (EELS),
illustrate some of the various functions, and present
application examples for STEM, XEDS, EELS in material
science.
Dr. Paul Haghi Ashtiani is an engineer with the French National
Center for Scientific Research (Centre National de la Recherche
Scientifique – CNRS) and the lead microscopist at
CentralSupélec Institution of Engineer Education and Research
in Paris, France. He has more than seventeen years of experience
conducting advanced analyses with transmission electron
microscope and has more than twenty publications in peerreviewed
journals. His research interests include structural
analysis of carbon nanotube, polymers, and alloys using STEM,
XEDS, and EELS technology.
