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HEMI Seminar: Dr. Paul Ashtiani

December 19, 2018 @ 3:30 pm - 4:30 pm

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Probe-corrected scanning transmission electron

microscopy (STEM) offers superior performance in the

analysis of nanomaterial by providing atomic resolution

imaging and spectroscopy. This presentation aims to

review the specifications and characteristics of the FEI

Probe-Corrected Titan3™ 80-300 S/TEM, demonstrate the

capabilities of this advanced analytical workstation and its

attachments such as energy-dispersive X-ray spectroscopy

(XEDS) and electron energy loss spectroscopy (EELS),

illustrate some of the various functions, and present

application examples for STEM, XEDS, EELS in material

science.

Dr. Paul Haghi Ashtiani is an engineer with the French National

Center for Scientific Research (Centre National de la Recherche

Scientifique – CNRS) and the lead microscopist at

CentralSupélec Institution of Engineer Education and Research

in Paris, France. He has more than seventeen years of experience

conducting advanced analyses with transmission electron

microscope and has more than twenty publications in peerreviewed

journals. His research interests include structural

analysis of carbon nanotube, polymers, and alloys using STEM,

XEDS, and EELS technology.