January 10, 2017 - January 11, 2017
Marc De Graef, Professor of Materials Science and Engineering at Carnegie Mellon University will be hosting a HEMI Short Course on the foundations of Electron Microscopy.
The course will provide an in-depth overview of the physics of image and diffraction pattern formation in both Scanning Electron Microscopy (SEM) and Transmission Electron Microscopy (TEM).
Registration ends Dec. 20, 2016. Register by clicking here.